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Posts Tagged ‘Contributed’

Single and Multi-Mode VCSEL Testing

Posted on: September 12th, 2019

This Month’s spectra were contributed by a current Avantes customer in the manufacturing of Vertical Cavity Surface Emitting Lasers (VCSEL). Parameters Measured We utilize Avantes spectrometers to measure spectral peak…

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Reflection Spectra of Thin Film

Posted on: July 16th, 2019

Avantes engineers have been thinking “thin” this month, thin film that is. We are sharing thin film measurement data from a mulit-layer deposition collected through collaboration with Alan Streeter and…

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