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Spectroscopy Solutions

Advanced Spectroscopy Solutions for Solar Simulator Metrology, Thin Film Analysis & Field Applications

Avantes offers a suite of advanced spectroscopy tools tailored for precision across a range of applications. Our Ava-Reflectometer2 is purpose-built for accurate thin film thickness measurements, ideal for coatings like parylene and other optical layers. For solar metrology, the AvaSpec-Solar-Mini+ delivers high-performance spectroradiometric analysis of solar simulators, engineered to redefine solar simulator characterization with traceable, reliable data. When portability is key, our field spectroscopy kits provide a rugged, all-in-one solution for out-of-the-lab spectral measurements, enabling researchers and technicians to capture high-quality data in real-world environments.

Explore our Spectroscopy Solutions

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AvaReflectometer2: Simple, Reliable Thin Film Thickness Measurement

Our Ava-Reflectometer is a turnkey solution for accurate thin film thickness measurement, combining a halogen light source, reflection probe, and AvaSpec-Mini spectrometer to ensure consistent performance across coatings used in medical, electronics, aerospace, and more.

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AvaSpec-Solar-Mini+: Affordable Precision for Solar Simulator Characterization

Ensure precise solar simulator characterization with the AvaSpec-Solar-Mini+ spectroradiometer system — a compact, radiometrically calibrated solution designed to meet IEC 60904-9 standards for both pulsed and steady-state solar simulators, providing accurate spectral analysis across a wide wavelength range with robust hardware and intuitive software.

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AvaTrek: In-the-Field Spectroscopy Kits for Real-World Applications

Avantes’ AvaTrek Spectroscopy Field Kits offer a robust, portable platform for in-situ spectral analysis, equipping researchers and field scientists with the capability to obtain high-resolution, real-time optical measurements across diverse environmental conditions.

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