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AvaReflectometer2: Simple, Reliable Thin Film Thickness Measurement

Precisely Measure Thin Film Coating Thickness

Thin film coatings are essential across industries like medical devices, electronics, transportation, and aerospace, offering critical surface properties such as moisture resistance, chemical durability, dielectric strength, and thermal and UV stability. To ensure consistency and performance, accurate thickness monitoring is key. Our Ava-Reflectometer offers a user-friendly, turnkey solution for thin film thickness measurements. This integrated system combines a halogen light source, reflection probe, and AvaSpec-Mini spectrometer to deliver reliable reflection-based measurements across a wide range of thin film applications on both opaque and transparent substrates.

Meet the Ava-Reflectometer2

The Ava-Reflectometer is a fully integrated system designed for precise and convenient thin film thickness measurements. At its core is the AvaSpec-Nexos 2048CL spectrometer, offering a broad spectral range from 360 to 1100 nm, paired with the Avalight-HAL-S-Mini tungsten halogen light source for stable and consistent illumination. The system also includes a compact reflection probe, a mirror reference tile for calibration, and a built-in sample stage to simplify measurement setup. To streamline analysis, the included TF Measurement software provides a user-friendly, Windows-compatible interface, making it ideal for use in production environments. For added durability and portability, the entire system ships in a waterproof, custom foam-fitted Pelican case.

Download the Data Sheet

 

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