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Posts Tagged ‘Semiconductor’

Plasma Measurements and Diagnostics

Posted on: January 23rd, 2020

Background/Applications: Optical Emission Spectroscopy, often referred to as OES, is a widely used analytical method to determine the elemental composition of a broad range of metals. Types of samples which…

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Reflection Spectra of Thin Film

Posted on: July 16th, 2019

Avantes engineers have been thinking “thin” this month, thin film that is. We are sharing thin film measurement data from a mulit-layer deposition collected through collaboration with Alan Streeter and…

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