Exploring Thin Film Solutions
The Avantes 2020 Webinar Series concludes with an Exploration of Thin Film Metrology Solutions, hosted by Avantes’ own Damon Lenski and Dr. Alan Streater from Boulder Optical Design.
The Avantes, Inc. engineering team worked with Boulder Optics’ Dr. Alan Streater to develop a system for measuring the thickness of Parylene coatings on substrate samples using reflection spectra. The teams discuss their system and its applications in the real world while discussing instrument selection.
Register now to access the on-demand content.